Filter Results By:

Products

Applications

Manufacturers

Showing results: 1861 - 1875 of 2716 items found.

  • Boundary-Scan Controller for PXI-Express 'Hybrid' Slots or Plug-In Controller for PXI-Express Peripheral Slot

    JT 37×7/PXIE - JTAG Technologies Inc.

    High speed and performance JTAG Boundary-scan controller for PXI-Express ‘hybrid’ slots or plug-in controller for PXI-Express peripheral slot.The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.

  • PCIe-6346 , 8 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, Multifunction I/O Device

    785813-01 - NI

    PCIe, 8 AI (16-Bit, 500 kS/s), 2 AO, 24 DIO, Multifunction I/O Device - The PCIe-6346 offers analog I/O, digital I/O, and four 32-bit counters/timers for PWM, encoder, frequency, event counting, and more. The device delivers high-performance functionality, leveraging the high-throughput PCI Express (PCIe) bus and multicore-optimized driver and application software. Because of its multi-ADC architecture, the device offers simultaneous sampling. Onboard NI-STC3 timing and synchronization technology deliver advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe-6346 is well suited for a broad range of applications, from basic data logging to control and test automation. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.

  • PCIe-6376, 8 AI (16-Bit, 3.5 MS/s/ch), 2 AO, 24 DIO, Multifunction I/O Device

    785809-01 - NI

    8 AI (16-Bit, 3.5 MS/s/ch), 2 AO, 24 DIO, Multifunction I/O Device - The PCIe‑6376 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, four 32‑bit counters, and analog and digital triggering. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe‑6376 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the telecom industry; ultrasound and sonar testing; and high-energy physics. The included DAQExpress™ companion software provides basic measurement and analysis, while the NI‑DAQmx driver provides the ability to create customized automated measurement and control applications.

  • MPO Power Meter, MPO Light Source

    JW3224. JW3124 - Shanghai Joinwit optoelectronic Tech,co.,Ltd

    JW3224MPO Optical Power Meter and JW3124MPO Optical Light Source is special for testing MPO fiber. At recent years, as the rapid development of data centre and cloud computing, also with rapid growth of multi fibers” (MPO) requirement. However, on the site of measurement process, traditional single channel Optical power meter with complex measurement and low credibility. Based on this, JW3224&JW3124 MPO products arises at this monment. The product can test the insertion loss of MPO fibers and polarity with only one key, And the integration of a variety of data storage, threshold analysis, data export and other applications,Compared with the traditional instrument, the test efficiency of JW3224 & JW3124 is more than 10 times,it is the best choice for field application of MPO room test、calibration of production line、Determination of polarity.

  • Aerospace and Aviation Solutions

    LXinstruments GmbH

    SCOEs and EGSEs by LXinstruments are used during test and validation of satellite assemblies and modules in aerospace applications. As an example, we implemented solar array simulators, battery simulators and high-power load racks for a German satellite manufacturer for testing satellite power supply systems. Due to the high power ratings, the systems are partially equipped with water cooling. Specialized switching modules were developed for switching DC currents at high voltage levels; these can be programmed with SCPI commands via Ethernet.Our modular OTP² functional test platform is ideally suited for implementing durable, reliable test systems, e. g. for in-flight entertainment applications. Since the OTP2 platform is based on open interfaces, it can be quickly and easily adapted to any required communication busses and ARINC interfaces.

  • PXI RF Analog Signal Generator

    NI

    PXI RF Analog Signal Generators deliver the functionality of RF signal generators to the modular, compact PXI form factor. These modules support frequency ranges from 250 kHz to 20 GHz. You can combine PXI RF Analog Signal Generators with other PXI modular instrumentation to design automated test systems for radar, RF integrated circuits (RFICs), and automotive test applications.

  • Battery Test Chambers

    Russells Technical Products

    Our battery test chambers are equipped with safety features conforming to industry safety standards enabling testing to a variety of conditions and specifications including extreme temperature cycling, humidity, vibration, and/or altitude. Russells Technical Products battery test chambers are used in a wide range of battery testing applications including lithium ion, battery packs, lead acid batteries, modules and more.

  • Function Test Systems & Equipment

    Cincinnati Test Systems

    Cincinnati Test Systems (CTS) provides our customers with turnkey systems that include the design, manufacture and support of custom built lean cell and automated functional equipment testing solutions. We are a recognized global leader for providing test solutions integrated with advanced technology, precision instrumentation, information software written by CTS engineers with proven experience, and supported by a team of technical application specialist.

  • 6U cPCI / PXI / PXIe 6021 Full Size Chassis

    W-IE-NE-R, Plein & Baus GmbH

    The WIENER 6021 crate series can be outfitted with cPCI, PXI or PXIe backplanes to provide high performance chassis with highly reliable low-noise power supplies for these bus standards. Typical applications are data acquisition, beam line control and test instrumentation.

  • Benchtop Environmental Test Chambers

    Thermotron Industries

    Benchtop Test Chambers provide superior performance over a wide range of applications. Ideal for testing smaller products such as computer components, these chambers combine superior performance with compact design that is perfect for research and development or personal point-of-use testing.

  • Altitude Simulation

    MEDAS - HORIBA, Ltd.

    The MEDAS system is a compact altitude simulator that reproduces a wide range of environmental conditions. It allows for testing light- to heavy-duty vehicles, including Non-Road Mobile Machinery (NRMM). It is ideally suited for a range of testing applications, such as durability, RDE replication, emission tests and mapping as well as tests from component to vehicle level. The patented technology inside the MEDAS system allows dynamic changes on the simulated atmosphere with high accuracy. The system can also be moved between different test cells due to its compact design.

  • ESS Performance Test System

    Bloomy Controls, Inc.

    The Energy Storage System (ESS) Performance Test System is used to evaluate, test, and certify the performance of energy storage systems up to 2MW. The system is a configurable platform with over 200 channels of simultaneously measured AC and DC voltages and currents, environmental temperatures, airflow, and communications. Intuitive software provides real-time monitoring and analysis of power, energy and efficiency to adhere with industry standards. The test system interfaces hardware such as load banks, and controls the ESS to simulate utility applications such as peak shaving and frequency regulation.

  • Clock Generation Devices

    Analog Devices Inc.

    Analog Devices offers ultralow jitter clock generation products for wireless infrastructure, instrumentation, broadband, automatic test equipment, and other applications demanding subpicosecond performance. Our clock products are ideal for generating the high speed, low noise clock signals required to clock high performance analog-to-digital converters (ADCs) and digital-to-analog converters (DACs). ADI clock ICs integrate PLL cores, dividers, phase offset, skew adjust, and clock drivers in small chip scale packages.

  • Digital Pressure Gauges

    AMETEK Sensors, Test & Calibration

    We provide some of the world’s most popular digital test gauges for a variety of applications and markets. Included are intrinsically safe "percent of reading" gauges, process gauges, differential pressure gauges, panel mounted gauges, and gauges specifically designed for use in the maritime industry. Whether you’re looking for a gauge with long battery life to mount in hard to reach locations, a gauge to collect and store readings in the field in extreme conditions, or one that doesn’t require recalibration for up to three years, we have the perfect gauge for you.

  • EIS Interface (Electrochemical Impedance Spectroscopy)

    BATT470m - Newtons4th Ltd

    The BATT470m electrochemical impedance analysis interface (EIS) provides an easy to use battery/cell impedance test platform for the electrochemical industry. Utilizing the highly accurate PSM3750 frequency response analyzer from N4L, the BATT470 provides impedance measurement of batteries/cells up to 100V DC. With a frequency range of 100mHz to 1MHz, the BATT470m covers a wide range of applications. Our software package - PSMComm2, featuring “EIS” mode, displays the in-phase and quadrature impedance of the cell in Nyquist form as well as overall impedance (Z), in bode form.

Get Help